PANKRATOV, E. L. On Analytical Approach to Prognosis of Manufacturing of Voltage Divider Biasing Common Emitter Amplifier with Account Mismatch-Induced Stress – On Increasing of Density of Elements: On Analytical Approach to Prognosis of Manufacturing of Voltage Divider Biasing Common Emitter Amplifier with Account Mismatch-Induced Stress – On Increasing of Density of Elements. Asian Journal of Mathematical Sciences(AJMS), [S. l.], v. 3, n. 1, 2019. Disponível em: http://www.ajms.in/index.php/ajms/article/view/193. Acesso em: 14 may. 2024.